Advantest 93k Tester Manual
This is the most frequently accessed document for test developers. It covers software operations across different generations (SmarTest 7 and SmarTest 8).
The standard workflow for operating a 93k is as follows:
Defines the clock periods, drive edges, and strobe windows for digital functional testing. Levels Files (.lev): Establishes the operating voltages ( VIHcap V sub cap I cap H end-sub VILcap V sub cap I cap L end-sub VOHcap V sub cap O cap H end-sub VOLcap V sub cap O cap L end-sub ) and current limits for the device pins.
Advantest’s SmarTest software is the operating system and programming environment for the 93k tester. The programming manual covers the creation of test programs. A. Test Program Structure advantest 93k tester manual
Step-by-step instructions for running "System Diagnostics" to isolate faulty instruments or channels.
The user interface running the Linux operating system and the SmarTest software suite, communicating with the tester via a dedicated high-speed optical link.
Always ensure your manual matches your software version (e.g., SmarTest 7.x vs SmarTest 8.x), as syntax and hardware capabilities vary drastically between them. This is the most frequently accessed document for
To help find more specific details, what are you currently working with? If there is a particular instrument card or test method (e.g., DC Parametric, High-Speed Digital, or RF ) you need to program, let me know! Share public link
It wasn't just a manual; it was a three-thousand-page brick of technical jargon that stood between him and a weekend in the mountains. The client’s newest SoC (System on a Chip) was throwing "Pin Continuity" errors on the tester, and the production line had ground to a halt. The Ghost in the Machine Elias flipped to the section on Universal Per-Pin Architecture
A graphical or text-based sequence control that dictates the exact execution order of individual test suites and manages binning (Pass/Fail routing). 3. Step-by-Step Test Program Execution Levels Files (
Use standard verification routines to loop back a driver channel into a receiver channel to pinpoint if the error is inside the tester or on the external load board.
This essential manual provides the information needed to design wafer probe cards and DUT boards specifically for the V93000 system. Third-Party and Specialty Guides
The top-level logical sequencer that decides the order of execution (e.g., run Continuity first; if pass, run Leakage; if fail, bin out the part). 4. SmarTest 7 vs. SmarTest 8 Programming Examples
An introductory manual covering GUI navigation, pattern loading, and basic datalogging.